1) QC Lab Equipment
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ZEISS CONTURA G2
ZEISS CONTURA enables you to be prepared today for the measurement requirements of tomorrow: The new generation is equipped with the mass technology and, thanks to a common interface, enables simple switching between different sensor technologies in just a few simple steps. In addition to innovative options such as measuring in four axes using a flexible rotary table, an automated probe changing system or the HTG option (for larger temperature ranges), the device also stands for first-class performance, ergonomics and future security.
Scherr Tumico Optical Comparator
An optical comparator is a measurement tool used to inspect and measure the dimensions of small manufactured parts. Images of the part are magnified using illumination sources, lenses and mirrors to make the 2-D measurement.
Profilometer
A profilometer is a measuring instrument used to measure a surface's profile, in order to quantify its roughness. Critical dimensions as step, curvature, flatness are computed from the surface topography.
Sheffield CMM
Very similar technology used as ZEISS listed above.
KEYENCE IM-6120
This contact height measurement unit reduces the time spent using separate measuring instruments for different measurement points and the effort spent in recording measurement results. The pattern search function can be used to automatically recognize and measure the height (depth) measurement points specified in advance. This function greatly reduces the time spent performing tasks related to measurement, such as the creation of operating procedures and the training of operators. In addition, strengthening measurement results can lead to improvements in the overall efficiency of measurement work.
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